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1

A genetic algorithm-based circuit partitioner for MCMs

Ananta K. Majhi, L.M. Patnaik, Srilata Raman

Journal:

Microprocessing and Microprogramming

Year:

1995

Language:

english

File:

PDF, 1.15 MB

english, 1995

2

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects

Geuzebroek, Jeroen, Marinissen, Erik Jan, Majhi, Ananta, Glowatz, Andreas, Hapke, Friedrich

Year:

2007

Language:

english

File:

PDF, 184 KB

english, 2007

3

A Novel Path Delay Fault Simulator Using Binary Logic

Majhi, Ananta K., Jacob, James, Patnaik, Lalit M.

Journal:

Year:

1996

Language:

english

File:

PDF, 2.76 MB

english, 1996

4

[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - Efficient Grouping of Fail Chips for Volume Yield Diagnostics

Jagan, Lavanya, Singh, Ratan Deep, Kamakoti, V., Majhi, Ananta K.

Year:

2009

Language:

english

File:

PDF, 221 KB

english, 2009

5

[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - On Performance Testing with Path Delay Patterns

Kruseman, Bram, Majhi, Ananta, Gronthoud, Guido

Year:

2007

Language:

english

File:

PDF, 253 KB

english, 2007

6

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - NIM- a noise index model to estimate delay discrepancies between silicon and simulation

Alpaslan, Elif, Dworak, Jennifer, Kruseman, Bram, Majhi, Ananta K, Heuvelman, Wilmar M, van de Wiel, Paul

Year:

2010

Language:

english

File:

PDF, 471 KB

english, 2010

7

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Power Supply Noise in Delay Testing

Wang, Jing, H. Walker, D., Majhi, Ananta, Kruseman, Bram, Gronthoud, Guido, Villagra, Luis, De Wiel, Paul, Eichenberger, Stefan

Year:

2006

Language:

english

File:

PDF, 258 KB

english, 2006

8

[IEEE 2010 23rd International Conference on VLSI Design: concurrently with the 9th International Conference on Embedded Systems Design (VLSID) - Bangalore, India (2010.01.3-2010.01.7)] 2010 23rd International Conference on VLSI Design - Impact of Temperature on Test Quality

Jagan, Lavanya, Hora, Camelia, Kruseman, Bram, Eichenberger, Stefan, Majhi, Ananta K., Kamakoti, V.

Year:

2010

Language:

english

File:

PDF, 274 KB

english, 2010

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